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Harries, J.; Tode, Mayumi; Sumimoto, Yuichi; Inoue, Keisuke; Yoshigoe, Akitaka; Teraoka, Yuden
no journal, ,
Photoelectron spectroscopy is predominantly a surface-sensitive technique, but by recording spectra at a range of angles information on the depth-dependent distribution of elements in specific chemical states can also be obtained. Compared to other techniques such as Rutherford back-scattering, the technique has the advantage of chemical-state specificity, but the drawback that it requires very careful data analysis to produce reliable and quantitative results. Here we report progress in obtaining chemical-state depth profiles from photoelectron spectra recorded using the SUREAC2000 apparatus at SPring-8's BL23SU. Results will be presented for ARXPS data recorded for N and O layers on Al(111), and also a VCrTi sample, both in its as-received state and following deuterium ion dosing.
Yamazaki, Daichi*; Kasai, Toshio*; Sowa, Makoto*; Okada, Michio*; Yoshigoe, Akitaka; Teraoka, Yuden
no journal, ,
Tode, Mayumi; Harries, J.; Teraoka, Yuden; Sumimoto, Yuichi; Inoue, Keisuke; Yoshigoe, Akitaka
no journal, ,
Yoshigoe, Akitaka; Teraoka, Yuden
no journal, ,
no abstracts in English